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Challenge |
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| This customer had a hipot specification that called out a number of different test voltages and dwell times for selected portions of the assembly being tested. The user wanted to avoid exposing the whole assembly to the higher test voltage and longest durations. |
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Solution |
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| Cirris developed a custom component on the Signature Touch 1 that lets the user select networks in the device under test to be either included or excluded during the hipot test, based on conditions presently defined in the wirelist.
When used with the parent/child wirelist component, a number of wirelists with varied hipot test parameters are chained together to form one complete test. |
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Results |
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| Voltage sensitive parts are protected while a more stringent test is performed on the rest of the assembly. |
© Cirris Systems Corp.