Do you risk damage to component parts such as diodes, resistors, capacitors, transistors, LED's and IC's when they are embedded in your assembly that is to be tested with high voltage?   Voltage implies a difference in potential between two points.   If the tester applies voltage across two or more component leads, you risk damaging these components.   Cirris testers prevent the application of voltage across components that have been included in the test program.   But, if those components are not part of the test program they may be at risk.   A more serious problem exists for many non-Cirris testers that cannot be programmed to protect your components.   For more information and a brief video about such testing see:

Do you have questions about hipot testing assemblies with components? See this month's video.

Sometimes customers ask us "what current do you use for the hipot test?"   Fortunately (for your cables) Cirris Hipot testers don't apply high voltage and high current at the same time.   They use high voltage, but very low current, to find problems in your cables, not create them.   This keeps energy levels low.   For an interesting look at what happens when you must have high voltage and high current together, check out this video:

See us next at these shows:

• Borderland, El Paso, TX Mar 14-15
• WHMA, Conference Indianapolis, IN Mar 22-24
• Assembly Canada, Toronto Mar 29-30
• NEPCON East, Boston May 10-11
• Wire Processing Expo, Milwaukee May 24-25